Business registries · firm from USPTO records
Cascade Microtech, Inc.
USPTO only Derived from USPTO records only (patent assignees and trademark owners); FURP found no state registration, Form D, Form ADV, nonprofit, SEC or lobbying record with this name and place.
- Place
- Reading, OH
- Entity type
- Not reported
- State of organization
- Not reported
- Patents
- 2 granted 2011-08-16 to 2012-08-14
- Trademarks
- 0
- Record
- EXACT high confidence: USPTO records only: one name
- Source
- USPTO: PVGPATDIS (PVGPATDIS file of 2026-04-10, TRCFECO2 file of 2024-03-27); one name
Patents
| Patent | Title | Granted | Source |
|---|---|---|---|
| US 9991152 | Wafer-handling end effectors with wafer-contacting surfaces and sealing structures | 2018-06-05 | PVGPATDIS, file of 2026-04-10 |
| US 9989558 | Probe head assemblies, components thereof, test systems including the same, and methods of operating the same | 2018-06-05 | PVGPATDIS, file of 2026-04-10 |
| US 9983232 | Prober for testing devices in a repeat structure on a substrate | 2018-05-29 | PVGPATDIS, file of 2026-04-10 |
| US 9874585 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | 2018-01-23 | PVGPATDIS, file of 2026-04-10 |
| US 9804196 | Probes with fiducial marks, probe systems including the same, and associated methods | 2017-10-31 | PVGPATDIS, file of 2026-04-10 |
| US 9784763 | Shielded probe systems with controlled testing environments | 2017-10-10 | PVGPATDIS, file of 2026-04-10 |
| US 9741599 | High voltage chuck for a probe station | 2017-08-22 | PVGPATDIS, file of 2026-04-10 |
| US 9506973 | High voltage chuck for a probe station | 2016-11-29 | PVGPATDIS, file of 2026-04-10 |
| US 9470753 | Systems and methods for testing electronic devices that include low power output drivers | 2016-10-18 | PVGPATDIS, file of 2026-04-10 |
| US 9435858 | Focusing optical systems and methods for testing semiconductors | 2016-09-06 | PVGPATDIS, file of 2026-04-10 |
| US 9429638 | Method of replacing an existing contact of a wafer probing assembly | 2016-08-30 | PVGPATDIS, file of 2026-04-10 |
| US 9395411 | Method for testing a test substrate under defined thermal conditions and thermally conditionable prober | 2016-07-19 | PVGPATDIS, file of 2026-04-10 |
| US 9377423 | Systems and methods for handling substrates at below dew point temperatures | 2016-06-28 | PVGPATDIS, file of 2026-04-10 |
| US 9373533 | Systems and methods for providing wafer access in a wafer processing system | 2016-06-21 | PVGPATDIS, file of 2026-04-10 |
| US 9372214 | High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same | 2016-06-21 | PVGPATDIS, file of 2026-04-10 |
| US 9245317 | Optically enhanced digital imaging system | 2016-01-26 | PVGPATDIS, file of 2026-04-10 |
| US 9244099 | Probe head assemblies, components thereof, test systems including the same, and methods of operating the same | 2016-01-26 | PVGPATDIS, file of 2026-04-10 |
| US 9194885 | Modular prober and method for operating same | 2015-11-24 | PVGPATDIS, file of 2026-04-10 |
| US 9110131 | Method and device for contacting a row of contact areas with probe tips | 2015-08-18 | PVGPATDIS, file of 2026-04-10 |
| US 9099449 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | 2015-08-04 | PVGPATDIS, file of 2026-04-10 |
| US 8970240 | Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same | 2015-03-03 | PVGPATDIS, file of 2026-04-10 |
| US 8922229 | Method for measurement of a power device | 2014-12-30 | PVGPATDIS, file of 2026-04-10 |
| US 8841932 | Prober for testing devices in a repeat structure on a substrate | 2014-09-23 | PVGPATDIS, file of 2026-04-10 |
| US 8823406 | Systems and methods for simultaneous optical testing of a plurality of devices under test | 2014-09-02 | PVGPATDIS, file of 2026-04-10 |
| US 8680879 | Chuck for supporting and retaining a test substrate and a calibration substrate | 2014-03-25 | PVGPATDIS, file of 2026-04-10 |
Trademarks
No US trademarks on file under this name.
Possible related entities
No other firm on file at the same street address (no street address in these USPTO records).
Firms here are built from USPTO patent assignees (PatentsView) and trademark owners: one firm per name (legal endings aside) and state, or country outside the US. Matches to other records are by name and state: EXACT means the identical full name, FUZZY a looser match, with the confidence shown.