Trademarks
APERIO
- Serial number
- 50168562
- Registration number
- Not registered
- Filed
- 2026-10-19
- Registered
- Not registered
- Status
- Pending application (USPTO status code 630, 2026-10-19; as of the dataset)
- Classes
- 009
- Elsewhere
- USPTO TSDR record (current status) ↗
- Source
- TRTDXFAP, file of 2026-10-20
Goods and services
Semiconductor metrology, inspection, review, and testing apparatus and instruments, namely, electron-beam and optical inspection systems, electron and scanning electron microscopes, critical dimension measurement systems, x-ray imaging systems, and defect review and defect analysis apparatus; Downloadable computer software for operating and controlling semiconductor metrology, inspection, review, and testing apparatus and instruments, and for image acquisition, defect detection, defect classification, defect review, critical dimension measurement, metrology data analysis, and yield analysis in semiconductor manufacturing.
Owners
| Owner | Role | Entity | Place | Also on furp.org | Source |
|---|---|---|---|---|---|
| Applied Materials, Inc. | Original applicant | Corporation | Santa Clara, CA | TRTDXFAP, file of 2026-10-20 |
Assignment history
No recorded assignments on file for this mark.
USPTO bulk data: the Trademark Case Files Dataset (TRCFECO2; the latest release, March 2024, runs through 2023) for marks, owners, classes and goods and services; the Trademark Assignment Dataset (TRASECO) for assignments. Marks filed in the last 20 years, plus older marks still registered. Status here is read from the dataset’s dates and status code; TSDR has the current status. Links to other records are by name (and state): EXACT means the identical full name and state; FUZZY means a looser name match, with the confidence shown.