Patents
US 12769989 B2: Fault criticality assessment using neural twins
- Granted
- 2026-10-20
- Filed
- 2021-10-01 application 17492118
- Type
- Utility · 20 claims
- Elsewhere
- Google Patents ↗ · USPTO patent document ↗ · USPTO Patent Center record ↗
Abstract
A method of fault criticality assessment using neural twins includes converting a netlist into a neural twin by replacing each circuit element of the netlist with a neural-network-readable cell equivalent; and replacing each wire with a neural connection. Bias value adders are inserted at locations in the neural twin; and these bias value adders are used to apply a bias that represents a perturbation in the signal propagated by that connection. For each perturbed bias at a corresponding site selected to be perturbed, a loss value is calculated for the neural twin; and the site is classified, using a neural-twin-trained classifier, as critical or benign based on that loss value.
Source: PTBLXML, file of 2026-10-20 (ipgb20261020.xml).
Assignees
| Assignee | Type | Place | Also on furp.org | Source |
|---|---|---|---|---|
| DUKE UNIVERSITY 1,375 patents | US company or organization | Durham, NC | Duke University College or university EXACT high confidence: identical full name and state DUKE UNIVERSITY Nonprofit EXACT high confidence: identical full name and state | PTBLXML, file of 2026-10-20 |
Inventors
| Inventor | Place | Patents | Person page | Source |
|---|---|---|---|---|
| Krishnendu Chakrabarty | Durham, NC | 25 | PTBLXML, file of 2026-10-20 | |
| Arjun Chaudhuri | Durham, NC | 7 | PTBLXML, file of 2026-10-20 |
CPC categories
| Subclass | Category | First group | Source |
|---|---|---|---|
| G06N | Computing arrangements based on specific computational models | G06N3/063 | PTBLXML, file of 2026-10-20 |
| G06F | Electric digital data processing | G06F18/24323 | PTBLXML, file of 2026-10-20 |
Cooperative Patent Classification, as currently assigned (one row per subclass).
Assignments and security interests
No recorded assignments or security interests on file for this patent.
USPTO bulk data: PatentsView granted patents, disambiguated (PVGPATDIS) for patents, assignees, inventors, places and CPC categories; the USPTO Patent Assignment Dataset (ECORSEXC) for assignments and security interests. Patents filed in the last 20 years. No claims or full text. Links to other records are by name (and state): EXACT means the identical full name and state; FUZZY means a looser name match, with the confidence shown.