Patents

US 12761308 B2: Multiple-range calibration for per-pin parametric measurement unit

Granted
2026-10-13
Filed
2024-05-14 application 18663893
Type
Utility · 22 claims
Elsewhere
Google Patents ↗ · USPTO patent document ↗ · USPTO Patent Center record ↗

Abstract

A test equipment system can provide signals to, or receive signals from, a device under test (DUT). The test system can include an output stage with output buffer circuitry that can be locally or externally controlled. An external controller can be used to provide precision input signals and, in response, measure current at a DUT interface node of the system, or measure voltage characteristics of various components inside the system. Using the input signals from the external controller, one or more aspects of the test system can be calibrated. For example, resistances of sense resistors in the output stage can be calibrated using current signals received from the external controller. In another example, buffer offset characteristics can be determined using signals from the external controller to control local drive circuitry of the system.

Source: PTBLXML, file of 2026-10-13 (ipgb20261013.xml).

Assignees

AssigneeTypePlaceAlso on furp.orgSource
Analog Devices, Inc. 2,069 patentsUS company or organizationWilmington, MAANALOG DEVICES INC SEC filer EXACT medium confidence: identical full name, one of each nationallyPTBLXML, file of 2026-10-13

Inventors

InventorPlacePatentsPerson pageSource
Andrew Nathan MortWexford, PA8PTBLXML, file of 2026-10-13
Amit Kumar SinghWoburn, MA93PTBLXML, file of 2026-10-13
Christopher C. McQuilkinHollis, NH16PTBLXML, file of 2026-10-13

CPC categories

SubclassCategoryFirst groupSource
G01RMeasuring electric variables; measuring magnetic variablesG01R35/005PTBLXML, file of 2026-10-13

Cooperative Patent Classification, as currently assigned (one row per subclass).

Assignments and security interests

No recorded assignments or security interests on file for this patent.

USPTO bulk data: PatentsView granted patents, disambiguated (PVGPATDIS) for patents, assignees, inventors, places and CPC categories; the USPTO Patent Assignment Dataset (ECORSEXC) for assignments and security interests. Patents filed in the last 20 years. No claims or full text. Links to other records are by name (and state): EXACT means the identical full name and state; FUZZY means a looser name match, with the confidence shown.