Patents
US 12761095 B2: Methods and apparatus of determining a stress-related characteristic of a substrate
- Granted
- 2026-10-13
- Filed
- 2024-09-05 application 18825641
- Type
- Utility · 29 claims
- Elsewhere
- Google Patents ↗ · USPTO patent document ↗ · USPTO Patent Center record ↗
Abstract
Apparatus includes a sample holder with a cavity and a plurality of devices configured to hold a curvature of a curved substrate in a fixed configuration. Apparatus includes two prisms with a viewing apparatus of the sample holder configured to translate therebetween. Methods can include disposing the curved substrate in the sample holder, transmitting a first beam, translating the sample holder, and transmitting a second beam. Alternatively, apparatus include a light scattering-polarimetry sub-system configured to emit a first beam to impinge an end surface of coupling prism and detect at least a portion of the first beam impinging the first surface of the coupling prism. The apparatus includes an evanescent prism coupling spectroscopy sub-system configured to emit a second beam to impinge a first surface of the coupling system and detect at least a portion of the second beam impinging the second surface of the coupling prism.
Source: PTBLXML, file of 2026-10-13 (ipgb20261013.xml).
Assignees
| Assignee | Type | Place | Also on furp.org | Source |
|---|---|---|---|---|
| CORNING INCORPORATED 4,960 patents | US company or organization | Corning, NY | CORNING INCORPORATED Federal lobbying client EXACT high confidence: identical full name and state | PTBLXML, file of 2026-10-13 |
Inventors
| Inventor | Place | Patents | Person page | Source |
|---|---|---|---|---|
| Ryan Claude Andrews | Elmira, NY | 20 | PTBLXML, file of 2026-10-13 | |
| David Matthew Berg | Rochester, NY | 7 | PTBLXML, file of 2026-10-13 | |
| Pierre Michel Bouzi | Manassas, VA | 5 | PTBLXML, file of 2026-10-13 | |
| William John Furnas | Elmira, NY | 15 | PTBLXML, file of 2026-10-13 | |
| Jacob Immerman | Corning, NY | 14 | PTBLXML, file of 2026-10-13 | |
| Jeremiah Robert Jacobson | Cambridge, MA | 4 | PTBLXML, file of 2026-10-13 | |
| Katherine Anne Lindberg | Corning, NY | 4 | PTBLXML, file of 2026-10-13 | |
| Andrew Allen Lindstrand | Big Flats, NY | PTBLXML, file of 2026-10-13 | ||
| Glenn Abram Newcomer | Pine City, NY | 4 | PTBLXML, file of 2026-10-13 | |
| Evan Lewis Olson | Elmira, NY | 5 | PTBLXML, file of 2026-10-13 | |
| Babak Robert Raj | Corning, NY | 5 | PTBLXML, file of 2026-10-13 | |
| Nathaniel David Wetmore | Corning, NY | 9 | PTBLXML, file of 2026-10-13 |
CPC categories
| Subclass | Category | First group | Source |
|---|---|---|---|
| G01L | Measuring force, stress, torque, work, mechanical power, mechanical efficiency, or fluid pressure | G01L1/241 | PTBLXML, file of 2026-10-13 |
| G01J | Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet light; colorimetry; radiation pyrometry | G01J3/14 | PTBLXML, file of 2026-10-13 |
| G01N | Investigating or analysing materials by determining their chemical or physical properties | G01N21/21 | PTBLXML, file of 2026-10-13 |
Cooperative Patent Classification, as currently assigned (one row per subclass).
Assignments and security interests
No recorded assignments or security interests on file for this patent.
USPTO bulk data: PatentsView granted patents, disambiguated (PVGPATDIS) for patents, assignees, inventors, places and CPC categories; the USPTO Patent Assignment Dataset (ECORSEXC) for assignments and security interests. Patents filed in the last 20 years. No claims or full text. Links to other records are by name (and state): EXACT means the identical full name and state; FUZZY means a looser name match, with the confidence shown.