Patents

US 12405210 B1: System for, and calibration and testing of directed beam ellipsometer systems

Granted
2025-09-02
Filed
2023-12-08 application 18445644
Type
Utility · 4 claims
Elsewhere
Google Patents ↗ · USPTO patent document ↗ · USPTO Patent Center record ↗

Abstract

Systems for and methodology of calibration, as well as testing of beam directing Ellipsometer systems which utilize polarized electromagnetic radiation to investigate samples.

Source: PVGPATDIS, file of 2026-04-10 (ipg250902.xml).

Assignees

AssigneeTypePlaceAlso on furp.orgSource
J.A. WOOLLAM CO., INC. 108 patentsUS company or organizationLincoln, NEJ.A. WOOLLAM CO., INC. State business registration EXACT high confidence: identical full name and statePVGPATDIS, file of 2026-04-10

Inventors

InventorPlacePatentsPerson pageSource
Ping HeLincoln, NE84PVGPATDIS, file of 2026-04-10
Martin M. LiphardtLincoln, NE78PVGPATDIS, file of 2026-04-10
Galen L. PfeifferRoca, NE29PVGPATDIS, file of 2026-04-10

CPC categories

SubclassCategoryFirst groupSource
G01NInvestigating or analysing materials by determining their chemical or physical propertiesG01N21/211PVGPATDIS, file of 2026-04-10

Cooperative Patent Classification, as currently assigned (one row per subclass).

Assignments and security interests

No recorded assignments or security interests on file for this patent.

USPTO bulk data: PatentsView granted patents, disambiguated (PVGPATDIS) for patents, assignees, inventors, places and CPC categories; the USPTO Patent Assignment Dataset (ECORSEXC) for assignments and security interests. Patents filed in the last 20 years. No claims or full text. Links to other records are by name (and state): EXACT means the identical full name and state; FUZZY means a looser name match, with the confidence shown.